Error-Control Coding in Computers
Computer
The Minimal Test Set for Multioutput Threshold Circuits Implemented as Sorting Networks
IEEE Transactions on Computers
The art of computer programming, volume 3: (2nd ed.) sorting and searching
The art of computer programming, volume 3: (2nd ed.) sorting and searching
New Implementations, Tools, and Experiments for Decreasing Self-Checking PLAs Area Overhead
ICCD '91 Proceedings of the 1991 IEEE International Conference on Computer Design on VLSI in Computer & Processors
Design of Fast Self-Testing Checkers for a Class of Berger Codes
IEEE Transactions on Computers
Design of Totally Self-Checking Code-Disjoint Synchronous Sequential Circuits
EDCC-3 Proceedings of the Third European Dependable Computing Conference on Dependable Computing
Design of Embedded Self-Testing Checkers for t-UED and BUED Codes
Journal of Electronic Testing: Theory and Applications
Self-Testing Embedded Borden t-UED Code Checkers for t=2kq-1 with q=2m-1
Journal of Electronic Testing: Theory and Applications
| Hi-index | 14.98 |
The optimal codes C(n, t) capable of detecting t-unidirectional errors in an n-bit vector were defined by Borden. Unidirectional errors have been observed in modern digital devices such as PLA's, ROM's, and compact laser disks. In this paper, a new approach to designing self-testing checkers (STCs) for Borden codes is proposed. The new STC is built of a self-testing code-disjoint translator of the Borden code into the 1-out-of-z code (z驴 2) and驴if z = 3 or 4驴an STC for the 1-out-of-z code. The translator is built of two multi-output threshold circuits with $\lfloor n/2 \rfloor$ and $\lceil n/2 \rceil$ inputs and a merging network. Compared to existing STC's for Borden codes the new checker generally uses significantly less hardware. It also enjoys a modular and highly regular structure which makes it attractive for VLSI implementation.