Systematic Unidirectional Error-Detecting Codes
IEEE Transactions on Computers
Burst Unidirectional Error-Detecting Codes
IEEE Transactions on Computers - The MIT Press scientific computation series
A self-checking generalized prediction checker and its use for built-in testing
IEEE Transactions on Computers
Systematic Unidirectional Burst Detecting Codes
IEEE Transactions on Computers - Fault-Tolerant Computing
Error-Control Coding in Computers
Computer
Design of Self-Testing Checkers for Borden Codes
IEEE Transactions on Computers
On-Line Testing for VLSI—A Compendium of Approaches
Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
Embedded Checker Architectures for Cyclic and Low-Cost Arithmetic Codes
Journal of Electronic Testing: Theory and Applications
Embedded Totally Self-Checking Checkers: A Practical Design
IEEE Design & Test
Guest Editors' Introduction: Online VLSI Testing
IEEE Design & Test
Efficient Totally Self-Checking Checkers for a Class of Borden Codes
IEEE Transactions on Computers
Self-Checking Comparator with One Periodic Output
IEEE Transactions on Computers
DFT '97 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems
A Design Technique of TSC Checker for Borden's Code
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Modular TSC Checkers for Bose-Lin and Bose Codes
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Programmable Embedded Self-Testing Checkers for All-Unidirectional Error-Detecting Codes
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Self-Testing Embedded Checkers for Bose-Lin, Bose,and a Class of Borden Codes
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Self-Testing Embedded Borden t-UED Code Checkers for t=2kq-1 with q=2m-1
Journal of Electronic Testing: Theory and Applications
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In this article we present a new method for designing self-testing checkers for t-UED and BUED codes. The main idea of this method is to map words of the considered code to words of a code of the same type in which the value of t or the number of check bits is reduced and repeating this with the obtained words until a parity code is obtained, or to translate the code words into words of a code for which such a mapping is possible. First we consider Borden codes for t = 2k − 1, Bose, and Bose-Lin codes. The mapping operation is realized by averaging weights and check symbol values of the code words. The resulting checkers have a simple and regular structure. This structure is independent on the set of code words that is provided by the circuit under check. The checkers are very well suited for use as embedded checkers since they are self-testing with respect to single stuck-at faults under very weak assumptions. All three checker types can be tested with 2 or 3 code words. We also propose a novel approach to design checkers for Blaum codes that require much less code word tests than existing solutions.