A self-checking generalized prediction checker and its use for built-in testing
IEEE Transactions on Computers
Optimal Self-Testing Embedded Parity Checkers
IEEE Transactions on Computers
Embedded Totally Self-Checking Checkers: A Practical Design
IEEE Design & Test
Efficient Modular Design of TSC Checkers for M-out-of-2M-Codes
IEEE Transactions on Computers
IEEE Transactions on Computers
On TSC Checkers for m-out-of-n Codes
IEEE Transactions on Computers
Self-Checking Comparator with One Periodic Output
IEEE Transactions on Computers
Embedded self-testing checkers for low-cost arithmetic codes
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
16.1 Novel Single and Double Output TSC Berger Code Checkers
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Design of a Self-Checking Microprogram Control
IEEE Transactions on Computers
Design of Totally Self-Checking Check Circuits for m-Out-of-n Codes
IEEE Transactions on Computers
On Totally Self-Checking Checkers for Separable Codes
IEEE Transactions on Computers
Self-Testing Embedded Parity Checkers
IEEE Transactions on Computers
Design of Embedded Self-Testing Checkers for t-UED and BUED Codes
Journal of Electronic Testing: Theory and Applications
Single- and Double-Output Embedded Checker Architectures for Systematic Unordered Codes"
Journal of Electronic Testing: Theory and Applications
A Formal Approach to On-Line Monitoring of Digital VLSI Circuits: Theory, Design and Implementation
Journal of Electronic Testing: Theory and Applications
On the Design of Self-Checking Controllers with Datapath Interactions
IEEE Transactions on Computers
Self-Testing Embedded Borden t-UED Code Checkers for t=2kq-1 with q=2m-1
Journal of Electronic Testing: Theory and Applications
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Code checkers monitor the outputs of a system in order to detect errors as soon as possible. The presented checker designs for m-out-of-n and Berger codes are well suited for use as embedded checkers since under very weak assumptions they are self-testing with respect to all single stuck-at faults and almost all combinational faults in a single cell. They are built from full adders and flip-flops and have a regular structure. The same checker circuit can be employed for m-out-of-n codes with different values of m. Also, the same circuit can be used for different types of Berger codes. The specific code is determined by the initialization of the checker register.