Burst Unidirectional Error-Detecting Codes
IEEE Transactions on Computers - The MIT Press scientific computation series
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IEEE Transactions on Computers
IEEE Transactions on Computers
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IEEE Design & Test
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IEEE Transactions on Computers
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IEEE Transactions on Computers
New Classes of Unidirectional Error-Detecting Codes
ICCD '91 Proceedings of the 1991 IEEE International Conference on Computer Design on VLSI in Computer & Processors
Fast and area-time efficient Berger code checkers
DFT '97 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems
Design of t-UED/AUED Codes from Berger's AUED Code
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Embedded two-rail checkers with on-line testing ability
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Highly testable and compact single output comparator
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
16.1 Novel Single and Double Output TSC Berger Code Checkers
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Programmable Embedded Self-Testing Checkers for All-Unidirectional Error-Detecting Codes
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Controllable self-checking checkers for conditional concurrent checking
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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For the detection of all unidirectional errors, Berger codes have been found to be an optimal choice in the general case. But for some particular cases other systematic unordered codes are superior to Berger codes. We present checker architectures for Berger-type codes that are similar to Berger codes. They cover codes by Parhami so that the proposed checkers can also be used for these codes. We also describe new checker architectures for Bose AUED codes and Biswas-Sengupta AUED codes. The design of these checkers is based on translating the code words to words of a Berger-type code which are then checked by a Berger-type code checker. The translation circuits are very simple. All checkers can be tested with only a few code words, or achieve the self-testing property almost independent of the provided set of code words, and are therefore very suitable as embedded checkers. The proposed checkers can be designed to have a single periodic output or a two-rail encoded output. Further, our checkers are not code-disjoint in the common sense but able to detect all single and multiple unidirectional errors.