Introduction to nMOS & VLSI systems design
Introduction to nMOS & VLSI systems design
A self-checking generalized prediction checker and its use for built-in testing
IEEE Transactions on Computers
IEEE Transactions on Computers
Efficient Design of Totally Self-Checking Checkers for all Low-Cost Arithmetic Codes
IEEE Transactions on Computers
Fault Tolerance in a Systolic Residue Arithmetic Processor Array
IEEE Transactions on Computers
Error-control coding for computer systems
Error-control coding for computer systems
Design of High-Speed and Cost-Effective Self-Testing Checkers for Low-Cost Arithmetic Codes
IEEE Transactions on Computers
An Algorithm for Scaling and Single Residue Error Correction in Residue Number Systems
IEEE Transactions on Computers
The design of a network-based arithmetic processor
The design of a network-based arithmetic processor
The Minimal Test Set for Multioutput Threshold Circuits Implemented as Sorting Networks
IEEE Transactions on Computers
Error Correction in Redundant Residue Number Systems
IEEE Transactions on Computers
Error Correcting Properties of Redundant Residue Number Systems
IEEE Transactions on Computers
The Design of Error Checkers for Self-Checking Residue Number Arithmetic
IEEE Transactions on Computers
Single Residue Error Correction in Residue Number Systems
IEEE Transactions on Computers
Design and Application of Self-Testing Comparators Implemented with MOS PLA's
IEEE Transactions on Computers
Totally Self-Checking Checker for 1-out-of-n Code Using Two-Rail Codes
IEEE Transactions on Computers
Error Detection and Correction by Product Codes in Residue Number Systems
IEEE Transactions on Computers
Totally Self-Checking Checkers for Low-Cost Arithmetic Codes
IEEE Transactions on Computers
Error Correction in Residue Arithmetic
IEEE Transactions on Computers
Hi-index | 0.01 |
Conventional fault-tolerant modulo arithmetic processors rely on the properties of a residue number system with L redundant moduli to detect up to L/2 errors. In this paper, we propose a new scheme that combines r-out-of-s. residue codes with Berger codes to concurrently detect any number of module errors without any redundant moduli. In addition, this scheme can tolerate L faults if L redundant moduli are used, and has the property of graceful degradation when the number of faulty moduli exceeds L. Finally, it is shown that the added cost for fault tolerance is much less than those were reported earlier in the literature.