Design Challenges of Technology Scaling
IEEE Micro
Simultaneous switching noise in on-chip CMOS power distribution networks
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Understanding and minimizing ground bounce during mode transition of power gating structures
Proceedings of the 2003 international symposium on Low power electronics and design
Impact of Simultaneous Switching Noise on the Static behavior of Digital CMOS Circuits
ATS '07 Proceedings of the 16th Asian Test Symposium
Enhanced leakage reduction techniques using intermediate strength power gating
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A robust power gating structure and power mode transition strategy for MTCMOS design
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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To suppress the ground bounce noise with a minimal wake-up time penalty, a three-step turn-on strategy and its corresponding power-gating structure are proposed. During the circuit's meta-stable region of operation, specifically, the amount of current flowing through the sleep transistors is precisely controlled while the virtual or circuit power supply is quickly boosted when the internal nodes of the circuit are stable. In 65 nm CMOS technology, simulation results demonstrate that our technique reduces the peak amplitude of the ground bouncing noise by up to 94% as compared to the conventional abrupt turn-on technique.