Reliable computer systems (3rd ed.): design and evaluation
Reliable computer systems (3rd ed.): design and evaluation
Redundant Disk Arrays: Reliable, Parallel Secondary Storage
Redundant Disk Arrays: Reliable, Parallel Secondary Storage
Reliability for Networked Storage Nodes
DSN '06 Proceedings of the International Conference on Dependable Systems and Networks
Enhanced Reliability Modeling of RAID Storage Systems
DSN '07 Proceedings of the 37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks
Disk failures in the real world: what does an MTTF of 1,000,000 hours mean to you?
FAST '07 Proceedings of the 5th USENIX conference on File and Storage Technologies
Failure trends in a large disk drive population
FAST '07 Proceedings of the 5th USENIX conference on File and Storage Technologies
Pergamum: replacing tape with energy efficient, reliable, disk-based archival storage
FAST'08 Proceedings of the 6th USENIX Conference on File and Storage Technologies
An analysis of data corruption in the storage stack
FAST'08 Proceedings of the 6th USENIX Conference on File and Storage Technologies
Understanding latent sector errors and how to protect against them
FAST'10 Proceedings of the 8th USENIX conference on File and storage technologies
Reliability analysis of deduplicated and erasure-coded storage
ACM SIGMETRICS Performance Evaluation Review
Disk Scrubbing Versus Intradisk Redundancy for RAID Storage Systems
ACM Transactions on Storage (TOS)
HPDA: A hybrid parity-based disk array for enhanced performance and reliability
ACM Transactions on Storage (TOS)
Understanding data survivability in archival storage systems
Proceedings of the 5th Annual International Systems and Storage Conference
XORing elephants: novel erasure codes for big data
Proceedings of the VLDB Endowment
Beyond MTTDL: A Closed-Form RAID 6 Reliability Equation
ACM Transactions on Storage (TOS)
Understanding the robustness of SSDS under power fault
FAST'13 Proceedings of the 11th USENIX conference on File and Storage Technologies
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Mean Time To Data Loss (MTTDL) has been the standard reliability metric in storage systems for more than 20 years. MTTDL represents a simple formula that can be used to compare the reliability of small disk arrays and to perform comparative trending analyses. The MTTDL metric is often misused, with egregious examples relying on the MTTDL to generate reliability estimates that span centuries or millennia. Moving forward, the storage community needs to replace MTTDL with a metric that can be used to accurately compare the reliability of systems in a way that reflects the impact of data loss in the real world.