Correlation controlled sampling for efficient variability analysis of analog circuits

Authors:
Javid Jaffari;Mohab Anis
Affiliations:
University of Waterloo, Waterloo, ON, Canada;University of Waterloo, Waterloo, ON, Canada
Venue:
Proceedings of the Conference on Design, Automation and Test in Europe
Year:
2010

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Abstract

The Monte Carlo (MC) simulation is a well-known solution to the statistical analysis of analog circuits in the presence of device mismatch. Despite MC's superior accuracy compared with that of the sensitivity-based techniques, an accurate analysis that involves traditional MC-based techniques requires large number of circuit simulations. In this paper, a correlation controlled sampling technique is developed to enhance the quality of the variance estimations. The superiority of the developed technique is verified by variability analysis of the input-referred offset voltage of a comparator, the frequency mismatch of a ring oscillator, and the AC parameters of an operational transconductance amplifier.