CAD for nanometer silicon design challenges and success
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Nanoelectronic circuits and systems
A defect tolerant self-organizing nanoscale SIMD architecture
Proceedings of the 12th international conference on Architectural support for programming languages and operating systems
Error detection/correction in DNA algorithmic self-assembly
Proceedings of the conference on Design, automation and test in Europe
DNA'06 Proceedings of the 12th international conference on DNA Computing
Error free self-assembly using error prone tiles
DNA'04 Proceedings of the 10th international conference on DNA computing
Array-based architecture for FET-based, nanoscale electronics
IEEE Transactions on Nanotechnology
A molecular solution for minimum vertex cover problem in tile assembly model
The Journal of Supercomputing
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DNA self-assembly is emerging as the most promising technique for nanoscale self-assembly as it uses the simple, yet precise rules of DNA binding to create macroscale assemblies from nanoscale components. However, DNA self-assembly is also highly error-prone and requires the use of error-resilience techniques in order to unlock its potential. In this paper we propose a technique for error-resilience that is based on information redundancy but, in contrast to previous information redundancy schemes, can achieve much higher resilience to growth errors. By expanding the neighborhood from which redundant information is taken, we can extend the distance that errors are propagated and therefore increase the likelihood of the error being reversed. Given a growth error rate of ε, we show that with a neighborhood of only 2 we can reduce the error rate to ε3.64 for arbitrary functions (as compared to ε2.33 previously achieved). Compared with spatial redundancy approaches, our technique allows for higher density nanostructures and has a greatly reduced assembly time.