The non-linear feedback shift-register as a built-in self-test (BIST) resource

  • Authors:

  • Peter N. Marinos

  • Affiliations:

  • Department of Electrical Engineering, Duke University, Durham, N. C.

  • Venue:
  • ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
  • Year:
  • 1988

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Abstract

The objective of this research was to study the properties of non-linear feedback shift-registers (NLFSR), and investigate their suitability as built-in self-test (BIST) components in VLSI circuits,