Partial hardware partitioning: a new pseudo-exhaustive test implementation

Authors:
Jon G. Udell, Jr.;Edward J. McCluskey
Affiliations:
Center for Reliable Computing, Departments of Electrical Engineering and Computer Science, Stanford University;Center for Reliable Computing, Departments of Electrical Engineering and Computer Science, Stanford University
Venue:
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Year:
1988

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Abstract

A new pseudo-exhaustive test implementation technique is presented. It combines the advantages of hardware partitioning and sensitized partitioning, offering lower hardware overhead than hardware partitioning, and lower test set generation complexity and higher fault coverage than sensitized partitioning.