Test generation for programmable logic arrays
DAC '82 Proceedings of the 19th Design Automation Conference
Detection of Faults in Programmable Logic Arrays
IEEE Transactions on Computers
On inherent untestability of unaugmented microprogrammed control
MICRO 22 Proceedings of the 22nd annual workshop on Microprogramming and microarchitecture
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Functional testing of VLSI devices may require a prohibitive amount of engineering time and/or produce poor fault coverage. Fully structured testing can grow the die enough to impact yield. A Judicious mixture of the two makes the MC68020 a highly testable chip without significantly affecting die size.