Color-Encoded Structured Light for Rapid Active Ranging
IEEE Transactions on Pattern Analysis and Machine Intelligence
3-D Surface Solution Using Structured Light and Constraint Propagation
IEEE Transactions on Pattern Analysis and Machine Intelligence
Range Imaging With Adaptive Color Structured Light
IEEE Transactions on Pattern Analysis and Machine Intelligence
Direct integration of reverse engineering and rapid prototyping
Computers and Industrial Engineering
One-Shot Active 3D Shape Acquisition
ICPR '96 Proceedings of the International Conference on Pattern Recognition (ICPR '96) Volume III-Volume 7276 - Volume 7276
Reconstruction of structured scenes from two uncalibrated images
Pattern Recognition Letters
A slicing algorithm of point cloud for rapid prototyping
Proceedings of the 2007 Summer Computer Simulation Conference
The Application of Fringe Projection Concept for Selective Data Acquisition
ICCAE '09 Proceedings of the 2009 International Conference on Computer and Automation Engineering
Fast acquisition of dense depth data by a new structured light scheme
Computer Vision and Image Understanding
Integrating cross-sectional imaging based reverse engineering with rapid prototyping
Computers in Industry
High-accuracy stereo depth maps using structured light
CVPR'03 Proceedings of the 2003 IEEE computer society conference on Computer vision and pattern recognition
A Perspective on Range Finding Techniques for Computer Vision
IEEE Transactions on Pattern Analysis and Machine Intelligence
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Selective data acquisition has been introduced recently for direct interfacing reverse engineering (RE) with rapid prototyping (RP). Data are acquired selectively and locally layer by layer according to the analysis of an image processing algorithm that has been developed for recommending the scanning positions from the edge images of the object. The recommendations, however, depend on the quality of the input images and the edge detection parameters. An attempt to make selective data acquisition more robust and less sensitive to the aforementioned factors is therefore presented in this paper. A structured light system (SLS) and projective transformation have been integrated into this SLS-based selective data acquisition to induce features on an object surface to appear explicitly through phase distortion of a projected bright line, and to diminish perspective distortion effects in the analysis through transformation of deformed bright lines on side views to be contour segments on top view. The implementation of this new selective data acquisition approach is also presented and discussed.