Introduction to the design of transconductor-capacitator filters
Introduction to the design of transconductor-capacitator filters
A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Test and design-for-test of mixed-signal integrated circuits
SBCCI '04 Proceedings of the 17th symposium on Integrated circuits and system design
An On-Chip Spectrum Analyzer for Analog Built-In Testing
Journal of Electronic Testing: Theory and Applications
A 1-MHz Area-Efficient On-Chip Spectrum Analyzer for Analog Testing
Journal of Electronic Testing: Theory and Applications
Practical implementation of a network analyzer for analog BIST applications
Proceedings of the conference on Design, automation and test in Europe
Microelectronic Circuits Revised Edition
Microelectronic Circuits Revised Edition
A BIST Solution for Frequency Domain Characterization of Analog Circuits
Journal of Electronic Testing: Theory and Applications
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This work presents a technique for the generation of analog sinusoidal signals with high spectral quality and reduced circuitry resources. Two integrated demonstrators are presented to show the feasibility of the approach. The proposed generation technique is based on a modified analog filter that provides a sinusoidal output as the response to a DC input. It has the attributes of digital programming and control, low area overhead, and low design effort, which make this approach very suitable as test stimulus generator for built-in test applications. The demonstrators--a continuous-time generator and a discrete-time one--have been integrated in a standard 0.35 μm CMOS technology. Simulation results and experimental measurements in the lab are provided, and the obtained performance is compared to current state-of-the-art on-chip generation strategies.