An On-Chip Spectrum Analyzer for Analog Built-In Testing
Journal of Electronic Testing: Theory and Applications
AUTOMATIC LINEARITY (IP3) TEST WITH BUILT-IN PATTERN GENERATOR AND ANALYZER
ITC '04 Proceedings of the International Test Conference on International Test Conference
Analog Integrated Circuits and Signal Processing
Making complex mixed-signal telecommunication integrated circuits testable
IEEE Communications Magazine
Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications
Journal of Electronic Testing: Theory and Applications
Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation
Journal of Electronic Testing: Theory and Applications
Digital-Compatible Testing Scheme for Operational Amplifier
Journal of Electronic Testing: Theory and Applications
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This paper presents a 0.35-驴m CMOS on-chip spectrum analyzer based on switched-capacitor (SC) techniques. The prototype device utilizes a 3-V supply and basically includes an SC sine-wave generator, a fourth-order high-selectivity SC filter, and a programmable gain amplifier followed by an 8-b analog-to-digital converter. A non-uniform sampling scheme, which adds one degree of freedom in determining the frequency response parameters of SC circuits, helps to obtain high programmability resolution without modifying any capacitor value. As a result, capacitor spread and total capacitor area are reduced as compared to traditional SC solutions and, hence, test area overhead is minimized. Experimental results demonstrate the effectiveness of the proposed approach to perform frequency response and total harmonic distortion measurements for frequencies up to 1 MHz.