Making complex mixed-signal telecommunication integrated circuits testable

Authors:
G. W. Roberts;B. Dufort
Affiliations:
McGill Univ., Montreal, Que.;-
Venue:
IEEE Communications Magazine
Year:
1999

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Abstract

This article presents a discussion of several methods that can be used to improve the testability of complex mixed-signal telecommunication integrated circuits. We begin by outlining the role of test and its impact on product cost and quality. A brief look at the pending test crises for mixed-signal circuits is also considered. Subsequently, we outline the evolution of test strategies with time, and their corresponding test setups for verifying the function of the analog portion of a mixed-signal circuit. The article also describes several circuit techniques for improving test access and providing built-in self-test solutions for telecommunication circuits