Diagnosis of Failing Scan Cells through Orthogonal Response Compaction

Authors:
Brady Benware;Grzegorz Mrugalski;Artur Pogiel;Janusz Rajski;Jedrzej Solecki;Jerzy Tyszer
Affiliations:
-;-;-;-;-;-
Venue:
ETS '11 Proceedings of the 2011 Sixteenth IEEE European Test Symposium
Year:
2011

Citing 0
Cited 2

Construction and Analysis of Augmented Time Compactors

Journal of Electronic Testing: Theory and Applications
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs

Journal of Electronic Testing: Theory and Applications

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Abstract

This paper presents a novel scheme to address the challenge of identifying failing scan cells from production test responses in the presence of scan compression. The scheme is based on a very simple test response compactor employing orthogonal--spatial and time--signatures. The advantage of this scheme as compared to previous work in this field is the simple and incremental nature of the compaction hardware required. The ability of the scheme to accurately identify failing scan cells from compacted responses has been measured on production fail data from five industrial designs and is reported herein.