A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
Digitally Assisted Analog Circuits
IEEE Micro
Verifying start-up conditions for a ring oscillator
Proceedings of the 18th ACM Great Lakes symposium on VLSI
Adaptive-bandwidth phase-locked loop with continuous background frequency calibration
IEEE Transactions on Circuits and Systems II: Express Briefs
Proceedings of the International Conference on Computer-Aided Design
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This paper proposes two practical approaches to address global convergence failures, commonly encountered in mixed-signal systems in which analog and digital components closely interact. That is, a nominally-working system may fail intermittently depending on its initial conditions upon start-up. The first approach uses a data clustering analysis and verifies global convergence with randomly-selected pilot simulations. The second approach adopts the practice of representing indeterminate states with X by defining its equivalent concept for analog based on entropy. With oscillator and phase-locked loop examples, it is demonstrated that the proposed approaches can effectively detect the failures and guide designers where to add more resets to prevent them.