Using grid based feature localization for fast image matching

  • Authors:
  • Daniel Fleck;Zoran Duric

  • Affiliations:
  • Department of Computer Science, American University, Washington DC;Department of Computer Science, American University, Washington DC

  • Venue:
  • ICIAR'11 Proceedings of the 8th international conference on Image analysis and recognition - Volume Part I
  • Year:
  • 2011

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Abstract

This paper presents a new model fitting approach to classify tentative feature matches as inliers or outliers during wide baseline image matching. The results show this approach increases the efficiency over traditional approaches (e.g. RANSAC) and other recently published approaches. During wide baseline image matching a feature matching algorithm generates a set of tentative matches. Our approach then classifies matches as inliers or outliers by determining if the matches are consistent with an affine model. In image pairs related by an affine transformation the ratios of areas of corresponding shapes is invariant. Our approach uses this invariant by sampling matches in a local region. Triangles are then formed from the matches and the ratios of areas of corresponding triangles are computed. If the resulting ratios of areas are consistent, then the sampled matches are classified as inliers. The resulting reduced inlier set is then processed through a model fitting step to generate the final set of inliers. In this paper we present experimental results comparing our approach to traditional model fitting and other affine based approaches. The results show the new method maintains the accuracy of other approaches while significantly increasing the efficiency of wide baseline matching for planar scenes.