On using a dissimilarity representation method to solve the small sample size problem for face recognition

  • Authors:
  • Sang-Woon Kim

  • Affiliations:
  • Senior Member IEEE, Dept. of Computer Science and Engineering, Myongji University, Yongin, Korea

  • Venue:
  • ACIVS'06 Proceedings of the 8th international conference on Advanced Concepts For Intelligent Vision Systems
  • Year:
  • 2006

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Abstract

For high-dimensional classification tasks such as face recognition, the number of samples is smaller than the dimensionality of the samples. In such cases, a problem encountered in Linear Discriminant Analysis-based (LDA) methods for dimension reduction is what is known as the Small Sample Size (SSS) problem. Recently, a number of approaches that attempt to solve the SSS problem have been proposed in the literature. In this paper, a different way of solving the SSS problem compared to these is proposed. It is one that employs a dissimilarity representation method where an object is represented based on the dissimilarity measures among representatives extracted from training samples instead of from the feature vector itself. Thus, by appropriately selecting representatives and by defining the dissimilarity measure, it is possible to reduce the dimensionality and achieve a better classification performance in terms of both speed and accuracy. Apart from utilizing the dissimilarity representation, in this paper simultaneously employing a fusion technique is also proposed in order to increase the classification accuracy. The rationale for this is explained in the paper. The proposed scheme is completely different from the conventional ones in terms of the computation of the transformation matrix, as well as in controlling the number of dimensions. The present experimental results, which to the best of the authors' knowledge, are the first such reported results, demonstrate that the proposed mechanism achieves nearly identical efficiency results in terms of the classification accuracy compared with the conventional LDA-extension approaches for well-known face databases involving AT&T and Yale databases.