Shapes in the shadow: evolutionary dynamics of morphogenesis
Artificial Life
transsys: A Generic Formalism for Modelling Regulatory Networks in Morphogenesis
ECAL '01 Proceedings of the 6th European Conference on Advances in Artificial Life
Untidy Evolution: Evolving Messy Gates for Fault Tolerance
ICES '01 Proceedings of the 4th International Conference on Evolvable Systems: From Biology to Hardware
Proceedings of the European Conference on Genetic Programming
Self-Assembling Circuits with Autonomous Fault Handling
EH '02 Proceedings of the 2002 NASA/DoD Conference on Evolvable Hardware (EH'02)
A Taxonomy for artificial embryogeny
Artificial Life
A computational model for organism growth based on surface mesh generation
Journal of Computational Physics
A graph grammar approach to artificial life
Artificial Life
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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This paper is part of a larger project whose main objective is to demonstrate experimentally that the following hypothesis holds: computational developmental systems on a cellular structure are a) naturally fault-tolerant and b) evolvable. By naturally we mean that the system is not fault-tolerant by explicit design nor due to evolutionary pressure, but rather that the framework insures a high probability of fault-tolerance as an emergent property. In this paper, we propose to study the self-repair capacities of a specific developmental cellular system introduced in [13]. More specifically we compare the toroidal and the non-toroidal cases. Their evolvability is to be presented in details in a further article. All the examples studied here have been evolved to configure an abstract digital circuit. The evolved organisms are subjected to a series of different fault models and their self-repair abilities are reported. From the results exposed here, it can be concluded that, while not systematic, perfect self-repair, and hence fault-tolerance is a highly probable property of these organisms and that many of them even exhibit fully perfect self-repair behaviour under all tests performed.