Letters: Dual-ellipse fitting approach for robust gait periodicity detection

Authors:
Xianye Ben;Weixiao Meng;Rui Yan
Affiliations:
School of Information Science and Engineering, Shandong University, No.27, Shanda South Road, Jinan City, Shandong Province, PR China;School of Electronics Information Engineering, Harbin Institute of Technology, No.92, Western Dazhi Street, Nangang District, Harbin, Heilongjiang Province, PR China;Department of Mechanical, Aerospace & Nuclear Engineering, Rensselaer Polytechnic Institute, 110 8th Street, Jonsson Engineering Center Rm.2049, Troy, NY, USA
Venue:
Neurocomputing
Year:
2012

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Abstract

A new gait period detection algorithm, dual-ellipse fitting (DEF) approach, is proposed. DEF is that two regions of the whole silhouette divided by the centroid are fitted into two ellipses, respectively. We construct the gait fluctuation as a periodic function which depends on the eccentricities of two halves of the silhouette over time. Experimental results show that the proposed method is robust to scale, translation, direction of walking and carrying a bag.