A novel approach for affine point pattern matching

Authors:
H. Suesse;W. Ortmann;K. Voss
Affiliations:
Department of Computer Science, Friedrich-Schiller-University Jena, Jena, Germany;Department of Computer Science, Friedrich-Schiller-University Jena, Jena, Germany;Department of Computer Science, Friedrich-Schiller-University Jena, Jena, Germany
Venue:
ICIAR'06 Proceedings of the Third international conference on Image Analysis and Recognition - Volume Part II
Year:
2006

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Abstract

Affine point pattern matching (APPM) is an integral part of many pattern recognition problems. Given two sets P and Q of points with unknown assignments pi →qj between the points, no additional information is available. The following task must be solved: – Find an affine transformation T such that the distance between P and the transformed set Q′= TQ is minimal. In this paper, we present a new approach to the APPM problem based on matching in bipartite graphs. We have proved that the minimum of a cost function is an invariant under special affine transformations. We have developed a new algorithm based on this property. Finally, we have tested the performance of the algorithm on both synthetically generated point sets and point sets extracted from real images.