Specification-based test oracles for reactive systems
ICSE '92 Proceedings of the 14th international conference on Software engineering
Black-box testing: techniques for functional testing of software and systems
Black-box testing: techniques for functional testing of software and systems
The B-book: assigning programs to meanings
The B-book: assigning programs to meanings
Test templates: a specification-based testing framework
ICSE '93 Proceedings of the 15th international conference on Software Engineering
Software unit test coverage and adequacy
ACM Computing Surveys (CSUR)
Automated Test and Oracle Generation for Smart-Card Applications
E-SMART '01 Proceedings of the International Conference on Research in Smart Cards: Smart Card Programming and Security
A Comparison of the BTT and TTF Test-Generation Methods
ZB '02 Proceedings of the 2nd International Conference of B and Z Users on Formal Specification and Development in Z and B
Automating the Generation and Sequencing of Test Cases from Model-Based Specifications
FME '93 Proceedings of the First International Symposium of Formal Methods Europe on Industrial-Strength Formal Methods
Test Criteria Definition for B Models
FM '99 Proceedings of the Wold Congress on Formal Methods in the Development of Computing Systems-Volume I - Volume I
CASTING: A Formally Based Software Test Generation Method
ICFEM '97 Proceedings of the 1st International Conference on Formal Engineering Methods
Proceedings of the 16th IEEE international conference on Automated software engineering
Controlling test case explosion in test generation from B formal models: Research Articles
Software Testing, Verification & Reliability
Generation of test sequences from formal specifications: GSM 11-11 standard case study
Software—Practice & Experience
A-MOST '05 Proceedings of the 1st international workshop on Advances in model-based testing
Automatic generation of model based tests for a class of security properties
Proceedings of the 3rd international workshop on Advances in model-based testing
"integrare", a collaborative environment for behavior-oriented design
CDVE'07 Proceedings of the 4th international conference on Cooperative design, visualization, and engineering
Automatic test generation on a (U)SIM smart card
CARDIS'06 Proceedings of the 7th IFIP WG 8.8/11.2 international conference on Smart Card Research and Advanced Applications
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The growing complexity of new smart card platforms, including multi-subscription or multi-application functionalities, led up to more and more difficulty in testing such systems. In previous work, we have introduced a new method for automated test generation from state-based formal specifications (B abstract machines, UML/OCL models, Z specifications). This method uses cause-effect analysis and boundary computation to produce test cases as sequences of operation invocations. This method is embedded in a model-based test generator which has been exercised on several applications in the domain of smart card software (GSM 11-11 application, electronic purse system and Java Card transaction mechanism). In all these applications, a B abstract machine was built specifically for automatic test generation by an independent validation team. Writing a specific formal model for testing has been shown to be cost-effective, and has the advantages that it can be tailored towards the desired test objectives. This paper focuses on showing the application of this test generation process from formal models in the context of Smart Card applications. We describe how the test generation can be controlled by using several model coverage criteria. These criteria are of three kinds: multiple condition coverage, boundary-value coverage and behavior coverage. This makes it possible to generate a systematic minimal test suite achieving strong coverage results. The test engineer chooses the criteria depending on the application test objectives and then fully controls the test generation process.