Selecting Software Test Data Using Data Flow Information
IEEE Transactions on Software Engineering
Automatic Test Generation for Java-Card Applets
JavaCard '00 Revised Papers from the First International Workshop on Java on Smart Cards: Programming and Security
IF: An Intermediate Representation and Validation Environment for Timed Asynchronous Systems
FM '99 Proceedings of the Wold Congress on Formal Methods in the Development of Computing Systems-Volume I - Volume I
Test Generation Derived from Model-Checking
CAV '99 Proceedings of the 11th International Conference on Computer Aided Verification
An Approach to Symbolic Test Generation
IFM '00 Proceedings of the Second International Conference on Integrated Formal Methods
A Formal Approach to Conformance Testing
Proceedings of the IFIP TC6/WG6.1 Sixth International Workshop on Protocol Test systems VI
Formal Test Automation: A Simple Experiment
Proceedings of the IFIP TC6 12th International Workshop on Testing Communicating Systems: Method and Applications
STG: a tool for generating symbolic test programs and oracles from operational specifications
Proceedings of the 8th European software engineering conference held jointly with 9th ACM SIGSOFT international symposium on Foundations of software engineering
STG: A Symbolic Test Generation Tool
TACAS '02 Proceedings of the 8th International Conference on Tools and Algorithms for the Construction and Analysis of Systems
Verification Using Test Generation Techniques
FME '02 Proceedings of the International Symposium of Formal Methods Europe on Formal Methods - Getting IT Right
Towards Property Oriented Testing
Electronic Notes in Theoretical Computer Science (ENTCS)
Applying Model-Based Testing to HTML Rendering Engines --- A Case Study
TestCom '08 / FATES '08 Proceedings of the 20th IFIP TC 6/WG 6.1 international conference on Testing of Software and Communicating Systems: 8th International Workshop
Abstractions for Model-Based Testing
Electronic Notes in Theoretical Computer Science (ENTCS)
Model based testing with labelled transition systems
Formal methods and testing
Automatic test generation on a (U)SIM smart card
CARDIS'06 Proceedings of the 7th IFIP WG 8.8/11.2 international conference on Smart Card Research and Advanced Applications
Mastering test generation from smart card software formal models
CASSIS'04 Proceedings of the 2004 international conference on Construction and Analysis of Safe, Secure, and Interoperable Smart Devices
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We present work we axe engaged in to develop symbolic test generation techniques and apply those techniques to testing of smart card applications. Beginning with (1) a system specification and (2) a test purpose expressed as symbolic labelled-transition-systems, we automatically derive tests to check conformance of an implementation to the behaviors of the specification selected by the test purpose, We present an example taken from a case-study we are developing based on the application of these techniques to the CEPS e-purse specifications.