Automatic test generation on a (U)SIM smart card

Authors:
Céline Bigot;Alain Faivre;Christophe Gaston;Julien Simon
Affiliations:
Oberthur Card Systems, R&D – EMC, Nanterre, France;CEA/LIST, Saclay, Gif sur Yvette, France;CEA/LIST, Saclay, Gif sur Yvette, France;Oberthur Card Systems, R&D – EMC, Nanterre, France
Venue:
CARDIS'06 Proceedings of the 7th IFIP WG 8.8/11.2 international conference on Smart Card Research and Advanced Applications
Year:
2006

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Abstract

Usually, testing smart card software is carried-out by specialized engineers in a proprietary language. Testing represents generally half of smart card development effort. With the increasing use of semi-formal and formal modeling languages, such as UML, and the emergence of automatic test generators in the industry, we have studied a way to adapt these techniques for smart card. In this article, we present an automatic test generator, named AGATHA, and its architecture, which can handle UML specifications. Then, we suggest a way to model (U)SIM smart card functionalities in UML. We use the test generator on our (U)SIM smart card UML models and automatically produce our first test cases.