Application of very fast simulated reannealing (VFSR) to low power design

Authors:
Ali Manzak;Huseyin Goksu
Affiliations:
Suleyman Demirel University, Isparta, Turkey;Suleyman Demirel University, Isparta, Turkey
Venue:
SAMOS'05 Proceedings of the 5th international conference on Embedded Computer Systems: architectures, Modeling, and Simulation
Year:
2005

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Abstract

This paper addresses the problem of optimal supply and threshold voltage selection with device sizing by minimizing power consumption and maximizing battery charge capacitance using Very Fast Simulated Reannealing (VFSR). We assume that multiple supply voltages and multiple threshold voltage devices are available at gate level. Minimizing power consumption does not necessarily maximize battery charge capacitance. This paper achieves this by implementing both objectives in the cost function.