Detecting trapdoors in smart cards using timing and power analysis

Authors:
Jung Youp Lee;Seok Won Jung;Jongin Lim
Affiliations:
Graduate School of Information Security, Korea University, Seoul, Korea;Department of Information Security, Mokpo National University, ChonNam, Korea;Graduate School of Information Security, Korea University, Seoul, Korea
Venue:
TestCom'05 Proceedings of the 17th IFIP TC6/WG 6.1 international conference on Testing of Communicating Systems
Year:
2005

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Abstract

For economic reasons, in spite of security problems, the commands of re-initializing the card and writing patch code are widely used in smart cards. The current software tester has difficulty in detecting these trapdoor commands by reason that trapdoors are not published and programmed sophisticatedly. Up to now the effective way to detect them is to completely reveal and analyze the entire code of the COS with applications such as the ITSEC. It is, however, very time-consuming and expensive processes. We propose a new approach of detecting trapdoors in smart cards using timing and power analysis. By experiments, this paper shows that this approach is a more practical method than the current methods.