Least-Squares Fitting of Two 3-D Point Sets
IEEE Transactions on Pattern Analysis and Machine Intelligence
Principal Warps: Thin-Plate Splines and the Decomposition of Deformations
IEEE Transactions on Pattern Analysis and Machine Intelligence
Least-Squares Estimation of Transformation Parameters Between Two Point Patterns
IEEE Transactions on Pattern Analysis and Machine Intelligence
Handbook of mathematics (3rd ed.)
Handbook of mathematics (3rd ed.)
Hi-index | 0.00 |
Point-based registration with known correspondence is often used as either a stand-alone method or a part of a more complex algorithm. The goal of this type of registration is to align two sets of points with the same number of corresponding points using a selected transformation type. Presented are closed form solutions for the transformation parameters that optimally align two point sets in the least squares sense for the following transformation types: rigid, similarity, rigid with nonuniform scales, and a linear combination of basis functions. It is shown that those registration methods whose underlying transformations form a group satisfy the identity, symmetry, transitivity, and distortion properties.