RAM: rapid alignment method

  • Authors:
  • Ruben A. Muijrers;Jasper G. J. van Woudenberg;Lejla Batina

  • Affiliations:
  • ICIS/Digital Security group, Radboud University Nijmegen, Nijmegen, AJ, The Netherlands;Riscure BV, Delft, XJ, The Netherlands;ICIS/Digital Security group, Radboud University Nijmegen, Nijmegen, AJ, The Netherlands

  • Venue:
  • CARDIS'11 Proceedings of the 10th IFIP WG 8.8/11.2 international conference on Smart Card Research and Advanced Applications
  • Year:
  • 2011

Quantified Score

Hi-index 0.00

Visualization

Abstract

Several countermeasures against side-channel analysis result in misalignment of power traces, in order to make DPA more difficult. In this paper we propose a new algorithm to align the measurements after this desynchronizing through the variations of the internal clock, random delays, etc. The algorithm is based on the ideas of SIFT and U-SURF algorithm that were originally proposed for image recognition. The comparison with other known methods favors our solution in terms of efficiency and computational complexity.