Design of a C-testable booth multiplier using a realistic fault model

• Authors:

• Jos Van Sas;Chay Nowé;Didier Pollet;Francky Catthoor;Paul Vanoostende;Hugo De Man

• Affiliations:

• -;-;-;-;-;-

• Venue:
• Journal of Electronic Testing: Theory and Applications
• Year:
• 1994