Test Points Selection for Analog Fault Dictionary Techniques
Journal of Electronic Testing: Theory and Applications
A qualitative approach to multiple fault isolation in continuous systems
AAAI'07 Proceedings of the 22nd national conference on Artificial intelligence - Volume 1
Hierarchical test sequencing for complex systems
IEEE Transactions on Systems, Man, and Cybernetics, Part A: Systems and Humans
A model-based active testing approach to sequential diagnosis
Journal of Artificial Intelligence Research
A diagnostic reasoning approach to defect prediction
IEA/AIE'11 Proceedings of the 24th international conference on Industrial engineering and other applications of applied intelligent systems conference on Modern approaches in applied intelligence - Volume Part II
Conflict and error prevention and detection in complex networks
Automatica (Journal of IFAC)
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We consider the problem of constructing optimal and near-optimal test sequences for multiple fault diagnosis. The computational complexity of solving the optimal multiple-fault isolation problem is super exponential, that is, it is much more difficult than the single-fault isolation problem, which, by itself, is NP-hard. By employing concepts from information theory and AND/OR graph search and by exploiting the single fault testing strategies of Pattipati et al. (1990), we present several test sequencing algorithms for the multiple fault isolation problem. These algorithms provide a trade-off between the degree of suboptimality and computational complexity. Furthermore, we present novel diagnostic strategies that generate a diagnostic directed graph, instead of a traditional diagnostic tree, for multiple fault diagnosis. Using this approach, the storage complexity of the overall diagnostic strategy reduces substantially. The algorithms developed herein have been successfully applied to several real-world systems