Fundamentals of Computer Alori
Fundamentals of Computer Alori
The Design and Analysis of Computer Algorithms
The Design and Analysis of Computer Algorithms
Iterative test-point selection for analog circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
An Approach for Selection of Test Points for Analog Fault Diagnosis
DFT '03 Proceedings of the 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Test Points Selection for Analog Fault Dictionary Techniques
Journal of Electronic Testing: Theory and Applications
Sequential testing algorithms for multiple fault diagnosis
IEEE Transactions on Systems, Man, and Cybernetics, Part A: Systems and Humans
Test Points Selection for Analog Fault Dictionary Techniques
Journal of Electronic Testing: Theory and Applications
A Novel Test Point Selection Method for Analog Fault Dictionary Techniques
Journal of Electronic Testing: Theory and Applications
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The test points selection problem for analog fault dictionary is researched extensively in many literatures. Various test points selection strategies and criteria for Integer-Coded fault wise table are described and compared in this paper. Firstly, the construction method of Integer-Coded fault wise table for analog fault dictionary is described. Secondly, theory and algorithms associated with these strategies and criteria are reviewed. Thirdly, the time complexity and solution accuracy of existing algorithms are analyzed and compared. Then, a more accurate test points selection strategy is proposed based on the existing strategies. Finally, statistical experiments are carried out and the accuracy and efficiency of different strategies and criteria are compared in a set of comparative tables and figures. Theoretical analysis and statistical experimental results given in this paper can provide an instruction for coding an efficient and accurate test points selection algorithm easily.