Iterative test-point selection for analog circuits

Authors:
J. Van Spaandonk;T. A. M. Kevenaar
Affiliations:
-;-
Venue:
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Year:
1996

Citing 0
Cited 5

Parametric fault diagnosis for analog systems using functional mapping

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Abstract

A method is presented which is useful for functional testing of analog circuits. It selects a set of rest points from a large set of candidate test points by combining a well-known decomposition technique from linear algebra with an iterative algorithm. The influence of random measurement errors is taken into account. Examples demonstrate that the method allows the circuit behavior to be determined with high precision, even in the presence of large measurement errors.