Fundamentals of Computer Alori
Fundamentals of Computer Alori
Iterative test-point selection for analog circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
An Approach for Selection of Test Points for Analog Fault Diagnosis
DFT '03 Proceedings of the 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Wavelet based fault detection in analog VLSI circuits using neural networks
Applied Soft Computing
An integrated approach for analog circuit testing with a minimum number of detected parameters
ITC'94 Proceedings of the 1994 international conference on Test
A Novel Test Point Selection Method for Analog Fault Dictionary Techniques
Journal of Electronic Testing: Theory and Applications
A SVDD approach of fuzzy classification for analog circuit fault diagnosis with FWT as preprocessor
Expert Systems with Applications: An International Journal
Closing the gap between analog and digital testing
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Nonlinear decision boundaries for testing analog circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A New ATPG Technique (ExpoTan) for Testing Analog Circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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The existing test node selection methods of analog dictionary technique assume that the voltage gap of ambiguity group is 0.7 V. However, this technique is not always accurate to determine the right ambiguity gap for each fault mode. As the probability density of the circuit output approximately satisfies the normal distribution, an accurate technique is introduced to determine the ambiguity gap. Then, this paper proposes a new test node selection method with an extended fault dictionary and the overlapped area values. Firstly, the fault dictionary is constructed with the mean and standard variance values of node voltage. Then, the area detection table is generated by the overlapped area values under normal curves for ambiguity faults, which represent the failure probability of ambiguity faults. Finally, the optimal test node set is selected by fusing fault isolation and overlapped area information. The results show that the proposed method is effective to select the optimal test node set and improve the performance of analog fault diagnosis.