Electrical interconnects revitalized

  • Authors:
  • C. Svensson

  • Affiliations:
  • Dept. of Electr. Eng., Linkoping Univ., Sweden

  • Venue:
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • Year:
  • 2002

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Abstract

Models of electrical interconnects, including inductance and skin effect, are reviewed. The models are used for estimating the performance of electrical interconnects, particularly related to delays, data rates, and power consumption for off-chip and on-chip interconnects and for clock distribution. It is demonstrated that correctly utilized, electrical interconnects do not severely limit chip or circuit board capacity. Delays, data rates, and power consumption of electrical interconnects within a circuit board are acceptable and superior to optical alternatives.