Energy Bounds for Fault-Tolerant Nanoscale Designs
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Rounds vs queries trade-off in noisy computation
SODA '05 Proceedings of the sixteenth annual ACM-SIAM symposium on Discrete algorithms
Lower Bounds for the Noisy Broadcast Problem
FOCS '05 Proceedings of the 46th Annual IEEE Symposium on Foundations of Computer Science
Nano, quantum, and molecular computing: are we ready for the validation and test challenges?
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
Nanocomputing in the presence of defects and faults: a survey
Nano, quantum and molecular computing
Tools and techniques for evaluating reliability trade-offs for NANO-architectures
Nano, quantum and molecular computing
Probabilistic maximum error modeling for unreliable logic circuits
Proceedings of the 17th ACM Great Lakes symposium on VLSI
Hybrid nanoelectronics: future of computer technology
Journal of Computer Science and Technology
Analysis of defect tolerance in molecular crossbar electronics
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
| Hi-index | 754.84 |
It is shown that if a formula is constructed from noisy 2-input NAND gates, with each gate failing independently with probability E, then reliable computation can or cannot take place according as ε is less than or greater than ε0=(3-√7)/4=0.08856…