Reliable computer systems (2nd ed.): design and evaluation
Reliable computer systems (2nd ed.): design and evaluation
Error control systems for digital communication and storage
Error control systems for digital communication and storage
Markov random field modeling in computer vision
Markov random field modeling in computer vision
Analysis of fault tolerance in artificial neural networks
Journal of Parallel and Distributed Computing
NanoFabrics: spatial computing using molecular electronics
ISCA '01 Proceedings of the 28th annual international symposium on Computer architecture
Carbon nanotube field-effect transistors and logic circuits
Proceedings of the 39th annual Design Automation Conference
PRISM: Probabilistic Symbolic Model Checker
TOOLS '02 Proceedings of the 12th International Conference on Computer Performance Evaluation, Modelling Techniques and Tools
Understanding belief propagation and its generalizations
Exploring artificial intelligence in the new millennium
Self-Assembling Circuits with Autonomous Fault Handling
EH '02 Proceedings of the 2002 NASA/DoD Conference on Evolvable Hardware (EH'02)
Teramac-configurable custom computing
FCCM '95 Proceedings of the IEEE Symposium on FPGA's for Custom Computing Machines
VLSID '04 Proceedings of the 17th International Conference on VLSI Design
FPGA '04 Proceedings of the 2004 ACM/SIGDA 12th international symposium on Field programmable gate arrays
NANOPRISM: a tool for evaluating granularity vs. reliability trade-offs in nano architectures
Proceedings of the 14th ACM Great Lakes symposium on VLSI
DSN '04 Proceedings of the 2004 International Conference on Dependable Systems and Networks
A Probabilistic-Based Design Methodology for Nanoscale Computation
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Modeling of Ballistic Carbon Nanotube Field Effect Transistors for Efficient Circuit Simulation
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Circuit Simulation of Nanotechnology Devices with Non-monotonic I-V Characteristics
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Nanocell logic gates for molecular computing
IEEE Transactions on Nanotechnology
A system architecture solution for unreliable nanoelectronic devices
IEEE Transactions on Nanotechnology
Array-based architecture for FET-based, nanoscale electronics
IEEE Transactions on Nanotechnology
NANOLAB-a tool for evaluating reliability of defect-tolerant nanoarchitectures
IEEE Transactions on Nanotechnology
On the maximum tolerable noise for reliable computation by formulas
IEEE Transactions on Information Theory
Complete and partial fault tolerance of feedforward neural nets
IEEE Transactions on Neural Networks
Toward Hardware-Redundant, Fault-Tolerant Logic for Nanoelectronics
IEEE Design & Test
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Computing systems implemented with nanotechnology will need to employ defect- and fault-tolerant measures to improve their reliability due to the large number of factors that may lead to imperfect device fabrication as well as the increased susceptibility to environmentally induced faults when using nanometer-scale devices. Researchers have approached this problem of reliability from many angles and this survey will discuss many promising examples, ranging from classical fault-tolerant techniques to approaches specific to nanocomputing. The research results summarized here also suggest that many useful, yet strikingly different solutions may exist for tolerating defects and faults within nanocomputing systems. Also included in the survey are a number of software tools useful for quantifying the reliability of nanocomputing systems in the presence of defects and faults