Analysis of defect tolerance in molecular crossbar electronics

Authors:
Jianwei Dai;Lei Wang;Faquir Jain
Affiliations:
Department of Electrical and Computer Engineering, University of Connecticut, Storrs, CT;Department of Electrical and Computer Engineering, University of Connecticut, Storrs, CT;Department of Electrical and Computer Engineering, University of Connecticut, Storrs, CT
Venue:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Year:
2009

Citing 20
Cited 2

Invariance of complexity measures for networks with unreliable gates

Journal of the ACM (JACM)
NanoFabrics: spatial computing using molecular electronics

ISCA '01 Proceedings of the 28th annual international symposium on Computer architecture
Energy-efficiency bounds for deep submicron VLSI systems in the presence of noise

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Nanowire-based sublithographic programmable logic arrays

FPGA '04 Proceedings of the 2004 ACM/SIGDA 12th international symposium on Field programmable gate arrays
Opportunities and challenges in application-tuned circuits and architectures based on nanodevices

Proceedings of the 1st conference on Computing frontiers
The Recursive NanoBox Processor Grid: A Reliable System Architecture for Unreliable Nanotechnology Devices

DSN '04 Proceedings of the 2004 International Conference on Dependable Systems and Networks
A mapping algorithm for defect-tolerance of reconfigurable nano-architectures

ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects

DFT '06 Proceedings of the 21st IEEE International Symposium on on Defect and Fault-Tolerance in VLSI Systems
An Overview of Nanoscale Devices and Circuits

IEEE Design & Test
Analysis of Mask-Based Nanowire Decoders

IEEE Transactions on Computers
On networks of noisy gates

SFCS '85 Proceedings of the 26th Annual Symposium on Foundations of Computer Science
Analysis of defect tolerance in molecular electronics using information-theoretic measures

NANOARCH '07 Proceedings of the 2007 IEEE International Symposium on Nanoscale Architectures
A defect-tolerant memory architecture for molecular electronics

IEEE Transactions on Nanotechnology
NANOLAB-a tool for evaluating reliability of defect-tolerant nanoarchitectures

IEEE Transactions on Nanotechnology
Bifurcations and fundamental error bounds for fault-tolerant computations

IEEE Transactions on Nanotechnology
Hierarchical fault tolerance for nanoscale memories

IEEE Transactions on Nanotechnology
Defect and Transient Fault-Tolerant System Design for Hybrid CMOS/Nanodevice Digital Memories

IEEE Transactions on Nanotechnology
On the maximum tolerable noise for reliable computation by formulas

IEEE Transactions on Information Theory
Signal propagation and noisy circuits

IEEE Transactions on Information Theory
Information capacity of nanowire crossbar switching networks

IEEE Transactions on Information Theory

An information-theoretic analysis of quantum-dot cellular automata for defect tolerance

ACM Journal on Emerging Technologies in Computing Systems (JETC)
Defect-tolerant logic hardening for crossbar-based nanosystems

Proceedings of the Conference on Design, Automation and Test in Europe

Quantified Score

Hi-index	0.00

Visualization

Abstract

Molecular electronics such as silicon nanowires (NW) and carbon nanotubes (CNT) demonstrate great potential for continuing the technology advances toward future nanocomputing paradigm. However, excessive defects from bottom-up stochastic assembly have emerged as a fundamental obstacle for achieving reliable computation using molecular electronics. In this paper, we present an information-theoretic approach to investigate the intrinsic relationship between defect tolerance and inherence redundancy in molecular crossbar systems. By modeling defect-prone molecular crossbars as a non-ideal information processing medium, we determine the information transfer capacity, which can be interpreted as the bound on reliability that a molecular crossbar system can achieve. The proposed method allows us to evaluate the effectiveness of redundancy-based defect tolerance in a quantitative manner. Employing this method, we derive the gap of reliability between redundancy-based defect tolerance and ideal defect-free molecular systems. We also show the implications to the related design optimization problem.