A defect-tolerant memory architecture for molecular electronics

Authors:
Myung-Hyun Lee;Young Kwan Kim;Yoon-Hwa Choi
Affiliations:
Dept. of Comput. Eng., Hongik Univ., Seoul, South Korea;-;-
Venue:
IEEE Transactions on Nanotechnology
Year:
2004

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Abstract

This paper presents a defect-tolerant memory architecture for molecular electronics. A crossbar structure, where molecules are sandwiched between nanowires, is used as a model to realize molecular memory and to achieve defect tolerance. Defects in the logic circuits for addressing memory are also taken into account. The number of spare rows and columns to form a functioning memory is estimated by computer simulation for various values of defect rate and memory size.