Improvements in Coverability Analysis
FME '02 Proceedings of the International Symposium of Formal Methods Europe on Formal Methods - Getting IT Right
On Static Test Compaction and Test Pattern Ordering for Scan Designs
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Test vector decomposition-based static compaction algorithms for combinational circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Specification-based compaction of directed tests for functional validation of pipelined processors
CODES+ISSS '08 Proceedings of the 6th IEEE/ACM/IFIP international conference on Hardware/Software codesign and system synthesis
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The problem of optimal test compression is to derive, from a given set of test vectors, a smallest possible subset of test vectors that still test for the same collection of faults. This achieves optimal compression and largest reduction possible in test time relative to the original set of test vectors. We present a new approach based on the modeling of the problem as the Set Cover problem. Additionally, the approach implies an ordering of the faults according to the difficulty of covering them with the given set of test vectors. As such it can be used to facilitate the finding of a solution to the ultimate smallest test-set-the compression of the set of all possible test vectors. Our approach highlights the potential usefulness of integer programming techniques in testing and design