A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits

Authors:
W. A. Pleskacz;C. H. Ouyang;W. Maly
Affiliations:
Inst. of Microelectron. & Optoelectron., Warsaw Univ. of Technol.;-;-
Venue:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Year:
2006

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Abstract

This paper describes an algorithm for the extraction of the critical area for opens. The presented algorithm allows for the analysis of industrial size ICs with non-Manhattan geometry. Illustrative examples of the proposed algorithm, implemented by using design rule checker operations, are presented. It is shown that the extraction of the critical area for realistic size VLSI circuits designs can be done in an acceptable time