Defect tolerance on the Teramac custom computer
FCCM '97 Proceedings of the 5th IEEE Symposium on FPGA-Based Custom Computing Machines
Electronics beyond nano-scale CMOS
Proceedings of the 43rd annual Design Automation Conference
Using TMR Architectures for Yield Improvement
DFT '08 Proceedings of the 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems
A Fault Tolerance Aware Synthesis Methodology for Threshold Logic Gate Networks
DFT '08 Proceedings of the 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems
DFT '09 Proceedings of the 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
A system architecture solution for unreliable nanoelectronic devices
IEEE Transactions on Nanotechnology
An Analysis of Internal Parameter Variations Effects on Nanoscaled Gates
IEEE Transactions on Nanotechnology
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One of the main objectives of the data computing and memory industry is to keep and ever accelerate the increase of component density reached in nowadays integrated circuits in future technologies based on ultimate CMOS and new emerging research devices. The worldwide-accepted predictions with these technologies indicate a remarkable reduction of the components quality, because of the manufacturing process complexity and the erratic behavior of devices, causing a drop in the system reliability if we maintain the same design rules than today. Together with the introduction of new devices, new architectural design paradigms have to be included. Fault tolerant techniques are considered necessary and relevant in this scenario. In this paper we present a fault-tolerant nanoscale architecture based on the implementation of logic systems with Averaging Cells Linear Threshold Gates (AC-LTGs). We compare the tolerance to manufacturing and environment deviation of our approach and the well known NAND multiplexing technique. We show that the AC-LTG is a valuable alternative in specific nanoscale conditions.