Clustered defect detection of high quality chips using self-supervised multilayer perceptron
Expert Systems with Applications: An International Journal
Letters: Prediction error of a fault tolerant neural network
Neurocomputing
Letters: Training RBF network to tolerate single node fault
Neurocomputing
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We investigate empirically the performance under damage conditions of single- and multilayer perceptrons (MLP's), with various numbers of hidden units, in a representative pattern-recognition task. While some degree of graceful degradation was observed, the single-layer perceptron was considerably less fault tolerant than any of the multilayer perceptrons, including one with fewer adjustable weights. Our initial hypothesis that fault tolerance would be significantly improved for multilayer nets with larger numbers of hidden units proved incorrect. Indeed, there appeared to be a liability to having excess hidden units. A simple technique (called augmentation) is described, which was successful in translating excess hidden units into improved fault tolerance. Finally, our results were supported by applying singular value decomposition (SVD) analysis to the MLP's internal representations