Extraction of crack-free isosurfaces from adaptive mesh refinement data

  • Authors:
  • Gunther H. Weber;Oliver Kreylos;Terry J. Ligocki;John M. Shalf;Han Hagen;Bernd Hamann;Kenneth I. Joy

  • Affiliations:
  • Department of Computer Science, University of California, Davis and Department of Computer Science, University of Kaiserslautern, Germany and National Energy Research Scientific Computing Center, ...;Department of Computer Science, University of California, Davis and National Energy Research Scientific Computing Center, Lawrence Berkeley National Laboratory, Berkeley;National Energy Research Scientific Computing Center, Lawrence Berkeley National Laboratory, Berkeley;National Energy Research Scientific Computing Center, Lawrence Berkeley National Laboratory, Berkeley and National Center for Supercomputing Applications, University of Illinois, Urbana-Champaign;Department of Computer Science, University of Kaiserslautern, Germany;Department of Computer Science, University of California, Davis and National Energy Research Scientific Computing Center, Lawrence Berkeley National Laboratory, Berkeley;Department of Computer Science, University of California, Davis

  • Venue:
  • EGVISSYM'01 Proceedings of the 3rd Joint Eurographics - IEEE TCVG conference on Visualization
  • Year:
  • 2001

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Abstract

Adaptive mesh refinement (AMR) is a numerical simulation technique used in computational fluid dynamics (CFD). It permits the efficient simulation of phenomena characterized by substantially varying scales in complexity of local behavior of certain variables. By using a set of nested grids at different resolutions, AMR combines the simplicity of structured rectilinear grids with the possibility to adapt to local changes in complexity and spatial resolution. Hierarchical representations of scientific data pose challenges when isosurfaces are extracted. Cracks can arise at the boundaries between regions represented at different resolutions. We present a method for the extraction of isosurfaces from AMR data that avoids cracks at the boundaries between levels of different resolution.