Negative correlation in the frequency responses of a pair of analogue circuits results in possible improvement of fault-tolerant performance

Authors:
Mingguo Liu;Jingsong He
Affiliations:
Department of Electronic Science and Technology, West Campus of University of Science and Technology of China, Huang Shan Road, Hefei City, Anhui Province, China;Department of Electronic Science and Technology, West Campus of University of Science and Technology of China, Huang Shan Road, Hefei City, Anhui Province, China
Venue:
International Journal of Computer Applications in Technology
Year:
2013

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Abstract

Analogue circuits play an important part in modern electronic systems. Existing works on evolutionary fault-tolerant design of analogue circuits are mainly based on the idea of introducing certain faults into the design process of analogue circuits. Via this idea, the fault-tolerant circuits may have outstanding ability of tolerance on the introduced-into-design-process faults. On the contrary, these circuits might be fragile under the impact of not-introduced-into-design-process faults. This paper proposes a novel method of fault-tolerant analogue circuit design method that is different from the existing works, which are based on the idea of introducing certain faults into the design process of analogue circuits. We do not introduce any faults into the design process of analogue circuits. As an alternative, we design a pair of analogue circuits, which are negatively correlated in the frequency responses. The experimental results show that the proposed method is a promising way of fault-tolerant analogue circuit design.