PLDI '90 Proceedings of the ACM SIGPLAN 1990 conference on Programming language design and implementation
The revised report on the syntactic theories of sequential control and state
Theoretical Computer Science
An observability-based code coverage metric for functional simulation
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Using model checking to generate tests from requirements specifications
ESEC/FSE-7 Proceedings of the 7th European software engineering conference held jointly with the 7th ACM SIGSOFT international symposium on Foundations of software engineering
Synchronous Programming of Reactive Systems
Synchronous Programming of Reactive Systems
Reinforced Condition/Decision Coverage (RC/DC): A New Criterion for Software Testing
ZB '02 Proceedings of the 2nd International Conference of B and Z Users on Formal Specification and Development in Z and B
Detecting and Debugging Insecure Information Flows
ISSRE '04 Proceedings of the 15th International Symposium on Software Reliability Engineering
Structural test coverage criteria for lustre programs
Proceedings of the 10th international workshop on Formal methods for industrial critical systems
Using Mutation Analysis for Assessing and Comparing Testing Coverage Criteria
IEEE Transactions on Software Engineering
Dytan: a generic dynamic taint analysis framework
Proceedings of the 2007 international symposium on Software testing and analysis
The effect of program and model structure on mc/dc test adequacy coverage
Proceedings of the 30th international conference on Software engineering
A data flow-based structural testing technique for FBD programs
Information and Software Technology
Verifying safety properties of lustre programs: an smt-based approach
Verifying safety properties of lustre programs: an smt-based approach
Better testing through oracle selection (NIER track)
Proceedings of the 33rd International Conference on Software Engineering
Assessing Oracle Quality with Checked Coverage
ICST '11 Proceedings of the 2011 Fourth IEEE International Conference on Software Testing, Verification and Validation
The influence of multiple artifacts on the effectiveness of software testing
The influence of multiple artifacts on the effectiveness of software testing
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Sequential equivalence checking based on structural similarities
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
OCCOM-efficient computation of observability-based code coverage metrics for functional verification
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the 34th International Conference on Software Engineering
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In many critical systems domains, test suite adequacy is currently measured using structural coverage metrics over the source code. Of particular interest is the modified condition/decision coverage (MC/DC) criterion required for, e.g., critical avionics systems. In previous investigations we have found that the efficacy of such test suites is highly dependent on the structure of the program under test and the choice of variables monitored by the oracle. MC/DC adequate tests would frequently exercise faulty code, but the effects of the faults would not propagate to the monitored oracle variables. In this report, we combine the MC/DC coverage metric with a notion of observability that helps ensure that the result of a fault encountered when covering a structural obligation propagates to a monitored variable; we term this new coverage criterion Observable MC/DC (OMC/DC). We hypothesize this path requirement will make structural coverage metrics 1.) more effective at revealing faults, 2.) more robust to changes in program structure, and 3.) more robust to the choice of variables monitored. We assess the efficacy and sensitivity to program structure of OMC/DC as compared to masking MC/DC using four subsystems from the civil avionics domain and the control logic of a microwave. We have found that test suites satisfying OMC/DC are significantly more effective than test suites satisfying MC/DC, revealing up to 88% more faults, and are less sensitive to program structure and the choice of monitored variables.