Silicon physical random functions
Proceedings of the 9th ACM conference on Computer and communications security
Reusable cryptographic fuzzy extractors
Proceedings of the 11th ACM conference on Computer and communications security
Security with Noisy Data: Private Biometrics, Secure Key Storage and Anti-Counterfeiting
Security with Noisy Data: Private Biometrics, Secure Key Storage and Anti-Counterfeiting
Fuzzy Extractors: How to Generate Strong Keys from Biometrics and Other Noisy Data
SIAM Journal on Computing
FPGA Intrinsic PUFs and Their Use for IP Protection
CHES '07 Proceedings of the 9th international workshop on Cryptographic Hardware and Embedded Systems
Efficient Helper Data Key Extractor on FPGAs
CHES '08 Proceeding sof the 10th international workshop on Cryptographic Hardware and Embedded Systems
Extended abstract: The butterfly PUF protecting IP on every FPGA
HST '08 Proceedings of the 2008 IEEE International Workshop on Hardware-Oriented Security and Trust
Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers
IEEE Transactions on Computers
Hardware intrinsic security from D flip-flops
Proceedings of the fifth ACM workshop on Scalable trusted computing
The context-tree weighting method: basic properties
IEEE Transactions on Information Theory
Anti-counterfeiting with hardware intrinsic security
Proceedings of the Conference on Design, Automation and Test in Europe
Bias-based modeling and entropy analysis of PUFs
Proceedings of the 3rd international workshop on Trustworthy embedded devices
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In this publication we present the results of our investigations into the reliability and uniqueness of Static Random Access Memories (SRAMs) in different technology nodes when used as a Physically Unclonable Function (PUF). The comparative analysis that can be found in this publication is the first ever of its kind, using different SRAM memories in technologies ranging from 180nm to 65nm. Each SRAM memory presents a unique and unpredictable start-up pattern when being powered up. In order to use an SRAM as a PUF in an application, the stability of its start-up patterns needs to be assured under a wide variety of conditions such as temperature and applied voltage. Furthermore the start-up patterns of different memories must be unique and contain sufficient entropy. This paper presents the results of tests that investigate these properties of different SRAM memory technology nodes. Furthermore, it proposes the construction of a fuzzy extractor, which can be used in combination with the tested memories for extracting secure cryptographic keys.