Efficient identification of hot data for flash memory storage systems
ACM Transactions on Storage (TOS)
On efficient wear leveling for large-scale flash-memory storage systems
Proceedings of the 2007 ACM symposium on Applied computing
Write off-loading: practical power management for enterprise storage
FAST'08 Proceedings of the 6th USENIX Conference on File and Storage Technologies
How i learned to stop worrying and love flash endurance
HotStorage'10 Proceedings of the 2nd USENIX conference on Hot topics in storage and file systems
FAST'11 Proceedings of the 9th USENIX conference on File and stroage technologies
Lifetime management of flash-based SSDs using recovery-aware dynamic throttling
FAST'12 Proceedings of the 10th USENIX conference on File and Storage Technologies
Lifetime improvement of NAND flash-based storage systems using dynamic program and erase scaling
FAST'14 Proceedings of the 12th USENIX conference on File and Storage Technologies
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We propose a new approach, called dynamic program and erase scaling (DPES), for improving the endurance of NAND flash memory. The DPES approach is based on our key finding that the NAND endurance is dependent on the erase voltage as well as the number of P/E cycles. Since the NAND endurance has a near-linear dependence on the erase voltage, lowering the erase voltage is an effective way of improving the NAND endurance. By modifying NAND chips to support multiple write modes with different erase voltages, DPES enables a flash software to exploit the new tradeoff between the NAND endurance and write speed. In this paper, we present a novel NAND endurance model which accurately captures the tradeoff relationship between the endurance and write speed under dynamic program and erase scaling. Based on our NAND endurancemodel, we have implemented the first DPES-aware FTL, called autoFTL, which improves the NAND endurance with a negligible degradation in the overall write throughput. Our experimental results using various I/O traces show that autoFTL can improve the maximum number of P/E cycles by 45% over an existing DPES-unaware FTL with less than 0.2% decrease in the overall write throughput.