Fractal recognition of compact artifacts on color images

Authors:
A. V. Nikonorov;E. Yu. Minaev
Affiliations:
Image Processing Systems Institute, Russian Academy of Sciences, Samara, Russia 443110;Chair of Informatics, Korolev State Aerospace University, Samara, Russia 443086
Venue:
Pattern Recognition and Image Analysis
Year:
2013

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Abstract

Analysis of small test fragments or compact artifacts is essential for many color correction problems. An efficient method of analysis is the recognition of compact artifacts. However, pattern recognition by features requires the determination of significant features for each applied problem. An alternative approach to the recognition of compact artifacts, which requires no feature extraction and is based on systems of iterated functions and comparison of their attractors, is proposed.